VIEW MicroLine AF Plus 2000 Optical Metrology Systems VIEW Micro-Metrology Malaysia, Selangor, Kuala Lumpur (KL) Supplier, Distributor, Supply, Supplies

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VIEW MicroLine AF Plus 2000

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Automated Critical Dimension Metrology System

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MicroLine_AF_Plus_VIEW-A4_799079.pdf (1.45 MB)

VIEW MicroLine AF Plus high performance critical dimention optical measurement systems are designed to measure wafers, masks, MEMS, and other micro-fabricated parts.

These capable desktop instruments provide precise automated optical measurement for features as small as 0.5µm on parts up to 300 x 300mm

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